We discuss a nanolocalization technique with sub-nanometer localization resolution based on position dependent transverse Kerker scattering, obtained via interference of tailored electric and magnetic dipole moments.

© 2018 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription