An analytic approach to the Mie scattering of highly focused fields is presented. By describing the incident field in terms of complex focus fields we can model the scattering and trapping properties of fields with many properties of interest.

© 2018 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription