Abstract

Absorption measurements above the K edges of the low-Z atoms, C, N, O, and F, are discussed, which utilize 250–1000-eV synchrotron radiation. The paper emphasizes experimental procedures of soft x-ray absorption and extended absorption fine structure (EXAFS) measurements as well as applications and future prospects of such studies. In particular, we discuss such applications as surface EXAFS, surface absorption fine structure, and ion yield EXAFS measurements.

© 1980 Optical Society of America

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