Abstract

A microchannel plate (MCP) detector blank has been used to focus x rays of 0.154-, 0.62-, and 0.84-nm wavelength generated by a microfocus x-ray tube and a laser-produced plasma. The focusing effect of MCP’s arises from total external reflection of x rays at the interior channel surfaces. Measurements of the intensity profiles of the images formed by the MCP have been made and compared with the predictions of a detailed model developed in Part I. [Appl. Opt. 32, 6316 (1993)]. It was found that the model gives a reliable description of the data. A consistent set of parameters was found from fits to the data at all three wavelengths.

© 1993 Optical Society of America

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