Abstract

Dynamic phase shifting is a temporal phase unwrapping method, i.e., a method in which a sequence of speckle patterns is analyzed along the time axis. Each pixel can thus be considered as an independent detector, which is of particular interest for the study of complex surfaces. I report the application of this technique, which is based on a wavelet analysis, to contouring measurements with a dual-beam illumination electronic speckle pattern interferometry setup. I present a new, more general geometric model of the setup. I also investigate the possibility of enhancing the accuracy by using the intermediate phase values. Tests are performed on a simply described object and compared with coordinate measuring machine measurements.

© 2006 Optical Society of America

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