Abstract

Intensity reflectances and ellipsometric parameters of a partially clad transparent substrate that suppresses the reflection of incident p- and s-polarized light at the same angle of incidence from uncoated and single-layer-coated areas are determined as functions of normalized film thickness ς and substrate refractive index n2. The common polarizing angle is the Brewster angle of the ambient–substrate interface, and the light beam incident from the ambient (air or vacuum) is refracted in the film at a 45° angle from the normal to the parallel-plane film boundaries. For n22, the differential reflection phase shift Δ=δpδs±90° for all values of ς so that the Brewster angle is also approximately the principal angle of the film–substrate system independent of film thickness. Accurate techniques for monitoring the deposition of such films are also proposed.

© 2016 Optical Society of America

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