Abstract

Digital speckle pattern interferometry and digital shearography are widely used in nondestructive testing due to their advantages of high speed, full field, and high sensitivity. However, traditional speckle pattern interferometry and shearography can only measure a single variable of deformation or strain. This study presents a modified common measurement setup that can simultaneously measure deformation and its first derivative. In the optical setup, a reference beam is introduced behind the shearing device to interfere with the object beams, thereby simplifying the spectrum and improving the quality of the phase maps. Then the spatial carrier technology is used to extract phase and achieve dynamic measurements. The proposed system also expands the measurement range using a ${4}f$ system. This study also presents a 3D optical setup based on the 1D system, which is more suitable for practical measurement applications in industrial areas. Theoretical derivation and experimental results are described and presented.

© 2019 Optical Society of America

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