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Correlation of Trace Silicone Contamination Analyses on Epoxy Composites Using X-ray Photoelectron Spectroscopy (XPS) and Laser-Induced Breakdown Spectroscopy (LIBS)

Rodolfo Ledesma, Frank Palmieri, Brooke Campbell, William Yost, James Fitz-Gerald, Giles Dillingham, and John Connell
Appl. Spectrosc. 73(2), 229-235 (2019)  View: PDF

Atmospheric Aerosol Multiband Synthesis Imaging Spectrometer

Xiaoxu Wang, Zihui Zhang, Shurong Wang, Yu Huang, Guanyu Lin, Zhanfeng Li, and Xiaohu Yang
Appl. Spectrosc. 73(2), 221-228 (2019)  View: PDF

Infrared Reflectance Spectroscopic Evaluation of Inkjet Printed Standards of Cyclotrimethylenetrinitramine (RDX) on Aluminum Substrates

Kenneth J. Ewing, Jasbinder Sanghera, Kevin J. Major, Mikella E. Farrell, Ellen L. Holthoff, and Paul M. Pellegrino
Appl. Spectrosc. 73(2), 214-220 (2019)  View: PDF

Measurement of Dysprosium Stark Width and the Electron Impact Width Parameter

Jhonatha R. dos Santos, Jonas Jakutis Neto, N. Rodrigues, M.G. Destro, José W. Neri, Patrícia Bueno, and Benedito Christ
Appl. Spectrosc. 73(2), 203-213 (2019)  View: PDF

Determination of Triacetone Triperoxide and Hexamethylene Triperoxide Diamine in Various Matrices Using Infrared Spectroscopy

Ondřej Vodochodský, Zdeněk Jalový, Robert Matyáš, and Miroslava Novotná
Appl. Spectrosc. 73(2), 195-202 (2019)  View: PDF

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