Abstract

A basic multi-wavelength x-ray fluorescence spectrometer has been designed and a two-goniometer prototype built. The instrument is of the dispersive type, using separate crystals, Geiger-Müller detectors, and counting circuits. The system, by providing for the simultaneous determination of more than one element, results in economy of testing time and in improved precision. Finally, an application to one type of ore analysis is described.

© 1953 Optical Society of America

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