Reflecting microscope systems have been used successfully to secure measurements on samples in the microgram range. However, the expense of the optical components and the assembly problems associated with coupling reflecting microscope systems to existing instruments, particularly double-beam spectrophotometers, have limited the applications.
The system described here uses relatively inexpensive silver chloride lenses which can be readily fabricated to meet individual instrumental requirements. The reduction in image size so far attained has not been as great as has been reported for reflecting systems, but many problems do not require large reductions of image size. In many cases, samples in the fractional milligram range are available for testing, and such samples can be tested with less elaborate equipment than the reflecting microscope systems. Initially a reduction of about in image size has been secured, which allows about a tenfold reduction in the normal sample size. Other trials we have made indicate that a reduction of at least in image size should be obtainable.
With the Baird Double-Beam Spectrophotometer now in use, samples in the range of 20 to 50 micrograms can be examined routinely with no change in slit settings or in amplifier gain. The lens unit is easily introduced into the instrument, and all the advantages of double-beam operation are retained.
© 1953 Optical Society of AmericaFull Article | PDF Article
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