Abstract

We propose a novel method for the construction of multiwavelength narrowband high-reflection filters consisting of a reflection mirror, a middle structure, and an induced-reflection match stack (IRMS). The results show that the peak position of the proposed reflection filters is identical to that of the transmission filters consisting of the same middle structure and two flanking high-reflection dielectric film stacks. The range in which multiple reflection peaks occur is determined by the degree of overlapping of the forbidden band in the reflection mirror and the conducting band in the middle structure. This range can be extended by changing the dielectric coefficients of the dielectric film stack or by substituting the dielectric reflection mirror with a silver mirror.

© 2009 Optical Society of America

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