Abstract

Independent measurements of the rms roughness and the reflectance have been made on silver films deposited on CaF2, LiF, and MgF2 thin films of various degrees of roughness. These measurements show a linear relationship between the dip in the magnitude of the near-normal reflectance minimum at the plasma energy and the rms roughness δ of the various samples. The autocovariance length of the rough surface turns out to have little influence on the relationship between the magnitude of the reflectance and δ. The relationships between the optical constants of silver films and δ are also investigated.

© 1990 Optical Society of America

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