A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

J. M. López-Alonso, J. Alda, and E. Bernabéu, “Principal-component characterization of noise for infrared images,” Appl. Opt.41, 320–331 (2002).

[Crossref]
[PubMed]

T. A. Germer and C. C. Asmail, “Goniometric optical scatter instrument for out-of-plane ellipsometry measurements,” Rev. Sci. Instrum. 70, 3688–3695 (1999).

[Crossref]

J. M. López-Alonso, J. Alda, and E. Bernabéu, “Principal-component characterization of noise for infrared images,” Appl. Opt.41, 320–331 (2002).

[Crossref]
[PubMed]

J. F. Blinn, “Models of light reflection for computer synthesized pictures,” Comput. Graphics 11, 192–198 (1977).

[Crossref]

A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

R. L. Cook and K. E. Torrance, “A reflectance model for computer graphics,” Technical report, Computer Graphics (ACM, 1981), Vol. 15, No. 3.

R. Corey, M. Kissner, and P. Saulnier, “Coherent backscattering of light,” Am. J. Phys. 63, 561–564 (1995).

[Crossref]

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

A. Ngan, F. Durand, and W. Matusik, “Experimental analysis of BRDF models,” Eurographics Symposium on Rendering, K. Bala and P. Dutre, eds. (2005).

A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

E. P. F. Lafortune, S. C. Foo, K. E. Torrance, and D. P. Greenberg, “Non-linear approximation of reflectance functions,” Technical report (Cornell University, 1997).

T. A. Germer and C. C. Asmail, “Goniometric optical scatter instrument for out-of-plane ellipsometry measurements,” Rev. Sci. Instrum. 70, 3688–3695 (1999).

[Crossref]

X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, “A comprehensive physical model for light reflection,” Technical report, Computer Graphics (1991), Vol. 25, No. 4.

E. P. F. Lafortune, S. C. Foo, K. E. Torrance, and D. P. Greenberg, “Non-linear approximation of reflectance functions,” Technical report (Cornell University, 1997).

D. Hünerhoff, U. Grusemann, and A Höpe, “New robot-based gonioreflectometer for measuring spectral diffuse reflection.” Metrologia 43, S11–S16 (2006).

[Crossref]

X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, “A comprehensive physical model for light reflection,” Technical report, Computer Graphics (1991), Vol. 25, No. 4.

D. Hünerhoff, U. Grusemann, and A Höpe, “New robot-based gonioreflectometer for measuring spectral diffuse reflection.” Metrologia 43, S11–S16 (2006).

[Crossref]

F. E. Nicodemus, J. C. Richmond, and J. J. Hsia, “Geometrical considerations and nomenclature for reflectance,” National Bureau of Standards Monograph (National Bureau of Standards, 1977), Vol. 160.

D. Hünerhoff, U. Grusemann, and A Höpe, “New robot-based gonioreflectometer for measuring spectral diffuse reflection.” Metrologia 43, S11–S16 (2006).

[Crossref]

T. J. Papetti, W. E. Walker, C. E. Keffer, and B. E. Johnson, “Coherent backscatter: measurement of the retroreflective BRDF peak exhibited by several surfaces relevant to ladar applications,” Proc. SPIE6682, 66820E (2007).

[Crossref]

T. J. Papetti, W. E. Walker, C. E. Keffer, and B. E. Johnson, “Coherent backscatter: measurement of the retroreflective BRDF peak exhibited by several surfaces relevant to ladar applications,” Proc. SPIE6682, 66820E (2007).

[Crossref]

R. Corey, M. Kissner, and P. Saulnier, “Coherent backscattering of light,” Am. J. Phys. 63, 561–564 (1995).

[Crossref]

E. P. F. Lafortune, S. C. Foo, K. E. Torrance, and D. P. Greenberg, “Non-linear approximation of reflectance functions,” Technical report (Cornell University, 1997).

S. H. Westin, H. Li, and K. E. Torrance, “A comparison of four BRDF models,” Technical report PCG-04-02, Program of Computer Graphics (Cornell University, April2004).

A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

J. M. López-Alonso, J. Alda, and E. Bernabéu, “Principal-component characterization of noise for infrared images,” Appl. Opt.41, 320–331 (2002).

[Crossref]
[PubMed]

A. Ngan, F. Durand, and W. Matusik, “Experimental analysis of BRDF models,” Eurographics Symposium on Rendering, K. Bala and P. Dutre, eds. (2005).

A. Ngan, F. Durand, and W. Matusik, “Experimental analysis of BRDF models,” Eurographics Symposium on Rendering, K. Bala and P. Dutre, eds. (2005).

F. E. Nicodemus, J. C. Richmond, and J. J. Hsia, “Geometrical considerations and nomenclature for reflectance,” National Bureau of Standards Monograph (National Bureau of Standards, 1977), Vol. 160.

T. J. Papetti, W. E. Walker, C. E. Keffer, and B. E. Johnson, “Coherent backscatter: measurement of the retroreflective BRDF peak exhibited by several surfaces relevant to ladar applications,” Proc. SPIE6682, 66820E (2007).

[Crossref]

B. T. Phong, “Illumination for computer generated pictures,” Commun. ACM 18(6), 311–317 (1975).

[Crossref]

A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

F. E. Nicodemus, J. C. Richmond, and J. J. Hsia, “Geometrical considerations and nomenclature for reflectance,” National Bureau of Standards Monograph (National Bureau of Standards, 1977), Vol. 160.

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

R. Corey, M. Kissner, and P. Saulnier, “Coherent backscattering of light,” Am. J. Phys. 63, 561–564 (1995).

[Crossref]

X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, “A comprehensive physical model for light reflection,” Technical report, Computer Graphics (1991), Vol. 25, No. 4.

X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, “A comprehensive physical model for light reflection,” Technical report, Computer Graphics (1991), Vol. 25, No. 4.

R. L. Cook and K. E. Torrance, “A reflectance model for computer graphics,” Technical report, Computer Graphics (ACM, 1981), Vol. 15, No. 3.

S. H. Westin, H. Li, and K. E. Torrance, “A comparison of four BRDF models,” Technical report PCG-04-02, Program of Computer Graphics (Cornell University, April2004).

E. P. F. Lafortune, S. C. Foo, K. E. Torrance, and D. P. Greenberg, “Non-linear approximation of reflectance functions,” Technical report (Cornell University, 1997).

T. J. Papetti, W. E. Walker, C. E. Keffer, and B. E. Johnson, “Coherent backscatter: measurement of the retroreflective BRDF peak exhibited by several surfaces relevant to ladar applications,” Proc. SPIE6682, 66820E (2007).

[Crossref]

G. J. Ward, “Measuring and modelling anisotropic reflection,” Comput. Graphics 26, 265–272 (1992).

[Crossref]

S. H. Westin, H. Li, and K. E. Torrance, “A comparison of four BRDF models,” Technical report PCG-04-02, Program of Computer Graphics (Cornell University, April2004).

R. Corey, M. Kissner, and P. Saulnier, “Coherent backscattering of light,” Am. J. Phys. 63, 561–564 (1995).

[Crossref]

F. B. Leloup, S. Forment, P. Dutré, M. R. Pointer, and P. Hanselaer, “Design of an instrument for measuring the spectral bidirectional scatter distribution function,” Appl. Opt. 47(29), 5454–5467 (2008).

[PubMed]

L. Simonot, “Photometric model of diffuse surfaces described as a distribution of interfaced Lambertian facets,” Appl. Opt. 48, 5793–5801 (2009).

[Crossref]
[PubMed]

A. Ferrero, J. Alda, J. Campos, J. M. López-Alonso, and A. Pons, “Principal components analysis of the photoresponse nonuniformity of a matrix detector,” Appl. Opt. 46, 9–17 (2007).

[Crossref]

B. T. Phong, “Illumination for computer generated pictures,” Commun. ACM 18(6), 311–317 (1975).

[Crossref]

G. J. Ward, “Measuring and modelling anisotropic reflection,” Comput. Graphics 26, 265–272 (1992).

[Crossref]

J. F. Blinn, “Models of light reflection for computer synthesized pictures,” Comput. Graphics 11, 192–198 (1977).

[Crossref]

D. Hünerhoff, U. Grusemann, and A Höpe, “New robot-based gonioreflectometer for measuring spectral diffuse reflection.” Metrologia 43, S11–S16 (2006).

[Crossref]

T. A. Germer and C. C. Asmail, “Goniometric optical scatter instrument for out-of-plane ellipsometry measurements,” Rev. Sci. Instrum. 70, 3688–3695 (1999).

[Crossref]

X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, “A comprehensive physical model for light reflection,” Technical report, Computer Graphics (1991), Vol. 25, No. 4.

R. L. Cook and K. E. Torrance, “A reflectance model for computer graphics,” Technical report, Computer Graphics (ACM, 1981), Vol. 15, No. 3.

F. E. Nicodemus, J. C. Richmond, and J. J. Hsia, “Geometrical considerations and nomenclature for reflectance,” National Bureau of Standards Monograph (National Bureau of Standards, 1977), Vol. 160.

E. P. F. Lafortune, S. C. Foo, K. E. Torrance, and D. P. Greenberg, “Non-linear approximation of reflectance functions,” Technical report (Cornell University, 1997).

S. H. Westin, H. Li, and K. E. Torrance, “A comparison of four BRDF models,” Technical report PCG-04-02, Program of Computer Graphics (Cornell University, April2004).

A. Ngan, F. Durand, and W. Matusik, “Experimental analysis of BRDF models,” Eurographics Symposium on Rendering, K. Bala and P. Dutre, eds. (2005).

J. M. López-Alonso, J. Alda, and E. Bernabéu, “Principal-component characterization of noise for infrared images,” Appl. Opt.41, 320–331 (2002).

[Crossref]
[PubMed]

A. M. Rabal, A. Ferrero, J. L. Fontecha, A. Pons, J. Campos, A. Corróns, and A. M. Rubio, “Gonio-spectrophotometer for low-uncertainty measurements of bidirectional scattering distribution function (BSDF),” Proceedings of CIE Expert Symposium on “Spectral and Imaging Methods for Photometry and Radiometry,” Publication CIE x036:2010 (CIE, Vienna, Austria, 2010), pp. 79–84.

T. J. Papetti, W. E. Walker, C. E. Keffer, and B. E. Johnson, “Coherent backscatter: measurement of the retroreflective BRDF peak exhibited by several surfaces relevant to ladar applications,” Proc. SPIE6682, 66820E (2007).

[Crossref]