Abstract

For applications involving time varying optical phase distributions, fast cameras and/or pulsed lasers have to be used. To apply phase–shifting interferometry techniques (PSI) as well, single shot capture is required. Among others, modulation of polarization and phase grating interferometry is a possible technique to be considered. In this paper, a report about the use of this technique based on a double pulse laser system is presented. Single–pulse and twin–pulse operations are considered both in optical interferometers as well as in ESPI systems (mainly in subtraction mode). In ESPI a reduction of the degree of polarization appears due to scattering, so some measures have to be taken to prevent such deletereous effect. To show the feasibility of the proposed variants some experimental results are presented.

© 2015 Optical Society of America

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  1. J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D. Malacara, ed. (John Wiley and Sons, 1992), 547–666.
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    [Crossref]
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    [Crossref]
  8. B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
    [Crossref]
  9. B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
    [Crossref]
  10. Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
    [Crossref]
  11. T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
    [Crossref]
  12. J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
    [Crossref]
  13. P. Gao, B. Yao, J. Min, R. Guo, J. Sheng, T. Ye, I. Harder, V. Nercissian, and K. Mantel, “Parallel two–step phase–shifting point–diffraction interferometry for microscopy based on a pair of cube beamsplitters,” Opt. Express 19(3), 1930–1935 (2011).
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    [Crossref]
  16. N. I. Toto-Arellano, V. H. Flores-Muñoz, and B. López-Ortiz, “Dynamic phase imaging of microscopic measurements using parallel interferograms generated from a cyclic shear interferometer,” Opt. Express 22(17), 20185–20192 (2014).
    [Crossref]
  17. B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
    [Crossref]
  18. T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
    [Crossref]
  19. J. R. Tyrer, “Structural analysis using phase–stepped, double pulsed ESPI,” Proc. SPIE 1162, 144–155 (1989).
    [Crossref]
  20. G. Pedrini and H. J. Tiziani, “Double–pulse electronic speckle interferometry for vibration analysis,” Appl. Opt. 33(34), 7857–7863 (1994).
    [Crossref] [PubMed]
  21. A. J. Moore, J. R. Tyrer, and F. M. Santoyo, “Phase extraction from electronic speckle pattern interferometry addition fringes,” Appl. Opt. 33(31), 7312–7320 (1994).
    [Crossref] [PubMed]
  22. A. Fernández, A. J. Moore, C. P. López, A. F. Doval, and J. Blanco-García, “Study of transient deformations with pulsed TV holography: application to crack detection,” Appl. Opt. 36(10), 2058–2065 (1997).
    [Crossref] [PubMed]
  23. A. J. Moore and C. P. López, “Fringe carrier methods in double–pulsed addition ESPI,” Opt. Commun. 141, 203–212 (1997).
    [Crossref]
  24. F. Santos, M. Vaz, and J. Chousal, “Dual beam ESPI system for measuring out–of–plane displacements,” in Experimental Mechanics, Balkema, ed. (Allison, 1998).
  25. A. J. Moore and C. Pérez-López, “Fringe visibility enhancement and phase calculation in double–pulsed addition ESPI,” J. Mod. Opt. 43(9), 1829–1844 (1996).
    [Crossref]
  26. A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high–speed camera,” Appl. Opt. 38(7), 1159–11162 (1999).
    [Crossref]
  27. G. O. Rosvald and O. J. Lokberg, “Effect and use of exposure control in vibration analysis using TV holography,” Appl. Opt. 32(5), 684–691 (1993).
    [Crossref]
  28. J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high–speed dynamic phase–stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
    [Crossref]
  29. C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
    [Crossref]
  30. C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
    [Crossref]
  31. G. Pedrini, W. Osten, and M. E. Gusev, “High–speed digital holographic interferometry for vibration measurement,” Appl. Opt. 45(15), 3456–3462 (2006).
    [Crossref] [PubMed]
  32. J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase–shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
    [Crossref]
  33. A. Davila, J. M. Huntley, G. H. Kaufmann, and D. Kerr, “High–speed dynamic speckle interferometry: phase errors due to intensity, velocity, and speckle decorrelation,” Appl. Opt. 44(19), 3954–3962 (2005).
    [Crossref] [PubMed]
  34. H. Helmers and M. Schellenberg, “CMOS vs. CCD sensors in speckle interferometry,” Opt. Laser Technol. 35, 587–595 (2003).
    [Crossref]
  35. T. Wu, J. D. C. Jones, and A. J. Moore, “High–speed phase–stepped digital speckle pattern interferometry using a complementary metal–oxide semiconductor camera,” Appl. Opt. 45(23), 5845–5855 (2006).
    [Crossref] [PubMed]
  36. C. Pérez-López, M. H. De la Torre-Ibarra, and F. M. Santoyo, “Very high speed cw digital holographic interferometry,” Opt. Express 14(21), 9709–9715 (2006).
    [Crossref]
  37. T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
    [Crossref] [PubMed]
  38. J. A. Leendertz, “Interferometric displacement measurement on scattering surfaces utilizing speckle effect,” J. Phys. 3, 214–218 (1970).
  39. G. Jin and S. Tang, “Electronic speckle pattern interferometer with a polarization phase–shift technique,” Optical Engineering 31(4), 857–860 (1992).
    [Crossref]
  40. C. Brosseau, Fundamentals of Polarized Light (Wiley, 1998).
  41. C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
    [Crossref]
  42. J. Broky and A. Dogariu, “Complex degree of mutual polarization in randomly scattered fields,” Opt. Express 18(19), 20105–20113 (2010).
    [Crossref] [PubMed]
  43. M. Zerrad, J. Sorrentini, G. Soriano, and C. Amra, “Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction,” Opt. Express 18(15), 15832–15843 (2010).
    [Crossref] [PubMed]
  44. A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).
  45. B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
    [Crossref]
  46. T. Y. Chen and C. H. Chen, “An instantaneous phase shifting ESPI system for dynamic deformation measurement,” in Optical measurements, Modeling, and Metrology, Volume 5, Conference Proceedings of the Society for Experimental Mechanics Series, T. Proulx, ed. (The Society for Experimental Mechanics, Inc., 2011), pp. 279–283.
    [Crossref]
  47. M. Servin and J. C. Estrada, “Analysis and synthesis of phase shifting algorithms based on linear systems theory,” Optics and Lasers in Engineering 50(8), 1009–1014 (2012).
    [Crossref]

2014 (2)

N. I. Toto-Arellano, V. H. Flores-Muñoz, and B. López-Ortiz, “Dynamic phase imaging of microscopic measurements using parallel interferograms generated from a cyclic shear interferometer,” Opt. Express 22(17), 20185–20192 (2014).
[Crossref]

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

2013 (1)

2012 (2)

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

M. Servin and J. C. Estrada, “Analysis and synthesis of phase shifting algorithms based on linear systems theory,” Optics and Lasers in Engineering 50(8), 1009–1014 (2012).
[Crossref]

2011 (1)

2010 (3)

2008 (5)

2006 (3)

2005 (2)

A. Davila, J. M. Huntley, G. H. Kaufmann, and D. Kerr, “High–speed dynamic speckle interferometry: phase errors due to intensity, velocity, and speckle decorrelation,” Appl. Opt. 44(19), 3954–3962 (2005).
[Crossref] [PubMed]

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

2004 (2)

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

2003 (2)

J. C. Wyant, “Dynamic interferometry,” Opt. Photon. News 14(4), 36–41 (2003).
[Crossref]

H. Helmers and M. Schellenberg, “CMOS vs. CCD sensors in speckle interferometry,” Opt. Laser Technol. 35, 587–595 (2003).
[Crossref]

2000 (1)

1999 (4)

1998 (2)

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
[Crossref]

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
[Crossref]

1997 (3)

A. Fernández, A. J. Moore, C. P. López, A. F. Doval, and J. Blanco-García, “Study of transient deformations with pulsed TV holography: application to crack detection,” Appl. Opt. 36(10), 2058–2065 (1997).
[Crossref] [PubMed]

A. J. Moore and C. P. López, “Fringe carrier methods in double–pulsed addition ESPI,” Opt. Commun. 141, 203–212 (1997).
[Crossref]

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

1996 (1)

A. J. Moore and C. Pérez-López, “Fringe visibility enhancement and phase calculation in double–pulsed addition ESPI,” J. Mod. Opt. 43(9), 1829–1844 (1996).
[Crossref]

1994 (2)

1993 (1)

1992 (1)

G. Jin and S. Tang, “Electronic speckle pattern interferometer with a polarization phase–shift technique,” Optical Engineering 31(4), 857–860 (1992).
[Crossref]

1989 (1)

J. R. Tyrer, “Structural analysis using phase–stepped, double pulsed ESPI,” Proc. SPIE 1162, 144–155 (1989).
[Crossref]

1978 (1)

T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
[Crossref]

1970 (1)

J. A. Leendertz, “Interferometric displacement measurement on scattering surfaces utilizing speckle effect,” J. Phys. 3, 214–218 (1970).

Amra, C.

M. Zerrad, J. Sorrentini, G. Soriano, and C. Amra, “Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction,” Opt. Express 18(15), 15832–15843 (2010).
[Crossref] [PubMed]

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

Awatsuji, Y.

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Awtsuji, Y.

Barrientos-García, B.

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

Barton, J. S.

Blanco-García, J.

Boreman, G.

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

Brock, N.

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

Broky, J.

Brosseau, C.

C. Brosseau, Fundamentals of Polarized Light (Wiley, 1998).

Bruning, J. H.

J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D. Malacara, ed. (John Wiley and Sons, 1992), 547–666.

Buckberry, C.

Butters, J. N.

T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
[Crossref]

Chen, C. H.

T. Y. Chen and C. H. Chen, “An instantaneous phase shifting ESPI system for dynamic deformation measurement,” in Optical measurements, Modeling, and Metrology, Volume 5, Conference Proceedings of the Society for Experimental Mechanics Series, T. Proulx, ed. (The Society for Experimental Mechanics, Inc., 2011), pp. 279–283.
[Crossref]

Chen, T. Y.

T. Y. Chen and C. H. Chen, “An instantaneous phase shifting ESPI system for dynamic deformation measurement,” in Optical measurements, Modeling, and Metrology, Volume 5, Conference Proceedings of the Society for Experimental Mechanics Series, T. Proulx, ed. (The Society for Experimental Mechanics, Inc., 2011), pp. 279–283.
[Crossref]

Chousal, J.

F. Santos, M. Vaz, and J. Chousal, “Dual beam ESPI system for measuring out–of–plane displacements,” in Experimental Mechanics, Balkema, ed. (Allison, 1998).

Cooksoon, T. J.

T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
[Crossref]

Creath, K.

K. Creath, “Phase measurements interferometry techniques,” in Progress in Optics, E. Wolf, ed. (Elsevier Science Publishers, 1988), 351–398.

Davila, A.

De la Torre-Ibarra, M. H.

Deumié, C.

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

Dogariu, A.

J. Broky and A. Dogariu, “Complex degree of mutual polarization in randomly scattered fields,” Opt. Express 18(19), 20105–20113 (2010).
[Crossref] [PubMed]

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

Doval, A. F.

Estrada, J. C.

M. Servin and J. C. Estrada, “Analysis and synthesis of phase shifting algorithms based on linear systems theory,” Optics and Lasers in Engineering 50(8), 1009–1014 (2012).
[Crossref]

Feinberg, L.

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

Fernández, A.

Flores-Muñoz, V. H.

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

N. I. Toto-Arellano, V. H. Flores-Muñoz, and B. López-Ortiz, “Dynamic phase imaging of microscopic measurements using parallel interferograms generated from a cyclic shear interferometer,” Opt. Express 22(17), 20185–20192 (2014).
[Crossref]

Franze, B.

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
[Crossref]

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
[Crossref]

Gao, P.

García-Lechuga, L.

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

Georges, G.

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

Greivenkamp, J. E.

J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D. Malacara, ed. (John Wiley and Sons, 1992), 547–666.

Guo, R.

Gusev, M. E.

Haible, P.

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
[Crossref]

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
[Crossref]

Hand, D. P.

Harder, I.

Hayes, J.

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

Helmers, H.

H. Helmers and M. Schellenberg, “CMOS vs. CCD sensors in speckle interferometry,” Opt. Laser Technol. 35, 587–595 (2003).
[Crossref]

Huntley, J. M.

Itoh, S.

Jin, G.

G. Jin and S. Tang, “Electronic speckle pattern interferometer with a polarization phase–shift technique,” Optical Engineering 31(4), 857–860 (1992).
[Crossref]

Joenathan, C.

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
[Crossref]

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
[Crossref]

Jones, J. D.

Jones, J. D. C.

Kakue, T.

Kaneko, A.

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Kaufmann, G. H.

Kerr, D.

Keski-Kuha, R.

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

Kiire, T.

Kilpatrick, J. M.

Koyama, T.

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Kubota, T.

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Kutsche, C.

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

Leendertz, J. A.

J. A. Leendertz, “Interferometric displacement measurement on scattering surfaces utilizing speckle effect,” J. Phys. 3, 214–218 (1970).

Likamwa, P.

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

Lokberg, O. J.

López, C. P.

López-Ortiz, B.

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

N. I. Toto-Arellano, V. H. Flores-Muñoz, and B. López-Ortiz, “Dynamic phase imaging of microscopic measurements using parallel interferograms generated from a cyclic shear interferometer,” Opt. Express 22(17), 20185–20192 (2014).
[Crossref]

Mantel, K.

Martínez-Domínguez, J. A.

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

Martínez-García, A.

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

N. I. Toto-Arellano, D. I. Serrano-García, and A. Martínez-García, “Parallel two-step phase shifting interferometry using a double cyclic shear interferometer,” Opt. Express 21(26), 31983–31989 (2013).
[Crossref]

Matoba, O.

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Meneses-Fabian, C.

Millerd, J.

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

Millerd, J. E.

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

J. E. Millerd and J. C. Wyant, “Simultaneous phase–shifting Fizeau interferometer,” U. S. Patent 7057738 B2 (2006).

Min, J.

Moore, A. J.

T. Wu, J. D. C. Jones, and A. J. Moore, “High–speed phase–stepped digital speckle pattern interferometry using a complementary metal–oxide semiconductor camera,” Appl. Opt. 45(23), 5845–5855 (2006).
[Crossref] [PubMed]

J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high–speed dynamic phase–stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]

A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high–speed camera,” Appl. Opt. 38(7), 1159–11162 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

A. J. Moore and C. P. López, “Fringe carrier methods in double–pulsed addition ESPI,” Opt. Commun. 141, 203–212 (1997).
[Crossref]

A. Fernández, A. J. Moore, C. P. López, A. F. Doval, and J. Blanco-García, “Study of transient deformations with pulsed TV holography: application to crack detection,” Appl. Opt. 36(10), 2058–2065 (1997).
[Crossref] [PubMed]

A. J. Moore and C. Pérez-López, “Fringe visibility enhancement and phase calculation in double–pulsed addition ESPI,” J. Mod. Opt. 43(9), 1829–1844 (1996).
[Crossref]

A. J. Moore, J. R. Tyrer, and F. M. Santoyo, “Phase extraction from electronic speckle pattern interferometry addition fringes,” Appl. Opt. 33(31), 7312–7320 (1994).
[Crossref] [PubMed]

Morris, M. N.

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

Nakadate, S.

Nercissian, V.

Nishio, K.

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

North-Morris, M.

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

Novak, M.

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

Osten, W.

Pedrini, G.

Pérez-López, C.

C. Pérez-López, M. H. De la Torre-Ibarra, and F. M. Santoyo, “Very high speed cw digital holographic interferometry,” Opt. Express 14(21), 9709–9715 (2006).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

A. J. Moore and C. Pérez-López, “Fringe visibility enhancement and phase calculation in double–pulsed addition ESPI,” J. Mod. Opt. 43(9), 1829–1844 (1996).
[Crossref]

Pollard, H. C.

T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
[Crossref]

Reeves, M.

Robledo-Sánchez, C.

Rodríguez-Zurita, G.

Rosvald, G. O.

Saif, B.

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

Saif, B. N.

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

Santos, F.

F. Santos, M. Vaz, and J. Chousal, “Dual beam ESPI system for measuring out–of–plane displacements,” in Experimental Mechanics, Balkema, ed. (Allison, 1998).

Santoyo, F. M.

Schellenberg, M.

H. Helmers and M. Schellenberg, “CMOS vs. CCD sensors in speckle interferometry,” Opt. Laser Technol. 35, 587–595 (2003).
[Crossref]

Serrano-García, D. I.

Servin, M.

M. Servin and J. C. Estrada, “Analysis and synthesis of phase shifting algorithms based on linear systems theory,” Optics and Lasers in Engineering 50(8), 1009–1014 (2012).
[Crossref]

Sheng, J.

Shibuya, M.

Siozade, L.

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

Soriano, G.

Sorrentini, J.

Tahara, T.

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Tang, S.

G. Jin and S. Tang, “Electronic speckle pattern interferometer with a polarization phase–shift technique,” Optical Engineering 31(4), 857–860 (1992).
[Crossref]

Tiziani, H. J.

Toto-Arellano, N. I.

Tschudi, T.

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

Tyrer, J. R.

Ura, S.

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

Vaz, M.

F. Santos, M. Vaz, and J. Chousal, “Dual beam ESPI system for measuring out–of–plane displacements,” in Experimental Mechanics, Balkema, ed. (Allison, 1998).

Vázquez-Castillo, J. F.

Wang, L.

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

Wu, T.

Wyant, J.

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

Wyant, J. C.

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

J. C. Wyant, “Dynamic interferometry,” Opt. Photon. News 14(4), 36–41 (2003).
[Crossref]

J. E. Millerd and J. C. Wyant, “Simultaneous phase–shifting Fizeau interferometer,” U. S. Patent 7057738 B2 (2006).

Xia, P.

Yao, B.

Ye, T.

Zerrad, M.

M. Zerrad, J. Sorrentini, G. Soriano, and C. Amra, “Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction,” Opt. Express 18(15), 15832–15843 (2010).
[Crossref] [PubMed]

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

Appl. Opt. (13)

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]

T. Kiire, S. Nakadate, and M. Shibuya, “Simultaneous formation of four fringes by using a polarization quadrature phase–shifting interferometer with wave plates and a diffraction grating,” Appl. Opt. 47(26), 4787–4792 (2008).
[Crossref] [PubMed]

Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography,” Appl. Opt. 47(19), 183–189 (2008).
[Crossref]

G. Pedrini and H. J. Tiziani, “Double–pulse electronic speckle interferometry for vibration analysis,” Appl. Opt. 33(34), 7857–7863 (1994).
[Crossref] [PubMed]

A. J. Moore, J. R. Tyrer, and F. M. Santoyo, “Phase extraction from electronic speckle pattern interferometry addition fringes,” Appl. Opt. 33(31), 7312–7320 (1994).
[Crossref] [PubMed]

A. Fernández, A. J. Moore, C. P. López, A. F. Doval, and J. Blanco-García, “Study of transient deformations with pulsed TV holography: application to crack detection,” Appl. Opt. 36(10), 2058–2065 (1997).
[Crossref] [PubMed]

A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high–speed camera,” Appl. Opt. 38(7), 1159–11162 (1999).
[Crossref]

G. O. Rosvald and O. J. Lokberg, “Effect and use of exposure control in vibration analysis using TV holography,” Appl. Opt. 32(5), 684–691 (1993).
[Crossref]

G. Pedrini, W. Osten, and M. E. Gusev, “High–speed digital holographic interferometry for vibration measurement,” Appl. Opt. 45(15), 3456–3462 (2006).
[Crossref] [PubMed]

J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase–shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
[Crossref]

A. Davila, J. M. Huntley, G. H. Kaufmann, and D. Kerr, “High–speed dynamic speckle interferometry: phase errors due to intensity, velocity, and speckle decorrelation,” Appl. Opt. 44(19), 3954–3962 (2005).
[Crossref] [PubMed]

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large–object deformation,” Appl. Opt. 37(13), 2608–2614 (1998).
[Crossref]

T. Wu, J. D. C. Jones, and A. J. Moore, “High–speed phase–stepped digital speckle pattern interferometry using a complementary metal–oxide semiconductor camera,” Appl. Opt. 45(23), 5845–5855 (2006).
[Crossref] [PubMed]

J. Mod. Opt. (2)

C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Large in–plane displacement measurement in dual–beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).
[Crossref]

A. J. Moore and C. Pérez-López, “Fringe visibility enhancement and phase calculation in double–pulsed addition ESPI,” J. Mod. Opt. 43(9), 1829–1844 (1996).
[Crossref]

J. Phys. (1)

J. A. Leendertz, “Interferometric displacement measurement on scattering surfaces utilizing speckle effect,” J. Phys. 3, 214–218 (1970).

Opt. Commun. (1)

A. J. Moore and C. P. López, “Fringe carrier methods in double–pulsed addition ESPI,” Opt. Commun. 141, 203–212 (1997).
[Crossref]

Opt. Express (10)

P. Gao, B. Yao, J. Min, R. Guo, J. Sheng, T. Ye, I. Harder, V. Nercissian, and K. Mantel, “Parallel two–step phase–shifting point–diffraction interferometry for microscopy based on a pair of cube beamsplitters,” Opt. Express 19(3), 1930–1935 (2011).
[Crossref] [PubMed]

C. Pérez-López, M. H. De la Torre-Ibarra, and F. M. Santoyo, “Very high speed cw digital holographic interferometry,” Opt. Express 14(21), 9709–9715 (2006).
[Crossref]

T. Kakue, S. Itoh, P. Xia, T. Tahara, Y. Awtsuji, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Single–shot femtosecond–pulsed phase–shifted digital holography,” Opt. Express 20(18), 20286–20291 (2012).
[Crossref] [PubMed]

N. I. Toto-Arellano, D. I. Serrano-García, and A. Martínez-García, “Parallel two-step phase shifting interferometry using a double cyclic shear interferometer,” Opt. Express 21(26), 31983–31989 (2013).
[Crossref]

N. I. Toto-Arellano, V. H. Flores-Muñoz, and B. López-Ortiz, “Dynamic phase imaging of microscopic measurements using parallel interferograms generated from a cyclic shear interferometer,” Opt. Express 22(17), 20185–20192 (2014).
[Crossref]

G. Rodríguez-Zurita, C. Meneses-Fabian, N. I. Toto-Arellano, J. F. Vázquez-Castillo, and C. Robledo-Sánchez, “One–shot phase–shifting phase–grating interferometry with modulation of polarization: case of four interferograms,” Opt. Express 16(11), 7806–7817 (2008).
[Crossref]

C. Amra, M. Zerrad, L. Siozade, G. Georges, and C. Deumié, “Partial polarization of light induced by random defects at surfaces or bulks,” Opt. Express 16(14), 10342–10354 (2008).
[Crossref]

J. Broky and A. Dogariu, “Complex degree of mutual polarization in randomly scattered fields,” Opt. Express 18(19), 20105–20113 (2010).
[Crossref] [PubMed]

M. Zerrad, J. Sorrentini, G. Soriano, and C. Amra, “Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction,” Opt. Express 18(15), 15832–15843 (2010).
[Crossref] [PubMed]

A. Dogariu, C. Kutsche, P. Likamwa, and G. Boreman, “Time–domain depolarization of waves retroreflected from dense colloidal media,” Opt. Express 22(9), 585–587 (1997).

Opt. Laser Technol. (2)

T. J. Cooksoon, J. N. Butters, and H. C. Pollard, “Pulsed lasers in electronic speckle pattern interferometry,” Opt. Laser Technol. 10(3), 119–124 (1978).
[Crossref]

H. Helmers and M. Schellenberg, “CMOS vs. CCD sensors in speckle interferometry,” Opt. Laser Technol. 35, 587–595 (2003).
[Crossref]

Opt. Lett. (2)

Opt. Photon. News (1)

J. C. Wyant, “Dynamic interferometry,” Opt. Photon. News 14(4), 36–41 (2003).
[Crossref]

Optical Engineering (2)

B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Spatial phase–stepped interferometry using a holographic optical element,” Optical Engineering 38(12), 2069–2074 (1999).
[Crossref]

G. Jin and S. Tang, “Electronic speckle pattern interferometer with a polarization phase–shift technique,” Optical Engineering 31(4), 857–860 (1992).
[Crossref]

Optical Review (1)

T. Tahara, Y. Awatsuji, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba, “Parallel two–step phase–shifting digital holography using polarization,” Optical Review 17(3), 108–113 (2010).
[Crossref]

Optics and Lasers in Engineering (1)

M. Servin and J. C. Estrada, “Analysis and synthesis of phase shifting algorithms based on linear systems theory,” Optics and Lasers in Engineering 50(8), 1009–1014 (2012).
[Crossref]

Optik (1)

B. López-Ortiz, N. I. Toto-Arellano, V. H. Flores-Muñoz, A. Martínez-García, L. García-Lechuga, and J. A. Martínez-Domínguez, “Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration,” Optik 125(24), 7227–7230 (2014).
[Crossref]

Proc. SPIE (4)

J. E. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. Wyant, “Pixelated phase–mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[Crossref]

J. R. Tyrer, “Structural analysis using phase–stepped, double pulsed ESPI,” Proc. SPIE 1162, 144–155 (1989).
[Crossref]

M. N. Morris, J. Millerd, N. Brock, J. Hayes, and B. Saif, “Dynamic phase–shifting electronic speckle pattern interferometer,” Proc. SPIE 5869, 58691B (2005).
[Crossref]

B. N. Saif, J. Millerd, R. Keski-Kuha, L. Feinberg, and J. C. Wyant, “Instantaneous phase–shifted speckle interferometer for measurement of large optical structures,” Proc. SPIE 5494, 152–155 (2004).
[Crossref]

Other (6)

T. Y. Chen and C. H. Chen, “An instantaneous phase shifting ESPI system for dynamic deformation measurement,” in Optical measurements, Modeling, and Metrology, Volume 5, Conference Proceedings of the Society for Experimental Mechanics Series, T. Proulx, ed. (The Society for Experimental Mechanics, Inc., 2011), pp. 279–283.
[Crossref]

C. Brosseau, Fundamentals of Polarized Light (Wiley, 1998).

J. E. Millerd and J. C. Wyant, “Simultaneous phase–shifting Fizeau interferometer,” U. S. Patent 7057738 B2 (2006).

J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D. Malacara, ed. (John Wiley and Sons, 1992), 547–666.

K. Creath, “Phase measurements interferometry techniques,” in Progress in Optics, E. Wolf, ed. (Elsevier Science Publishers, 1988), 351–398.

F. Santos, M. Vaz, and J. Chousal, “Dual beam ESPI system for measuring out–of–plane displacements,” in Experimental Mechanics, Balkema, ed. (Allison, 1998).

Supplementary Material (4)

NameDescription
» Visualization 1: AVI (9046 KB)      Dynamic interferograms
» Visualization 2: AVI (249 KB)      Dynamic interferogram phases
» Visualization 3: AVI (8303 KB)      Dynamic correlation fringes
» Visualization 4: AVI (597 KB)      Dynamic correlation fringe phases

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Figures (7)

Fig. 1
Fig. 1 Experimental system for optical and ESPI evaluation with modulation of polarization.

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Fig. 2
Fig. 2 Interferometric Mach–Zehnder arrangement for a) in–plane and b) out–of–plane displacement measurement.

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Fig. 3
Fig. 3 Schematic flow control of the synchronization process.

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Fig. 4
Fig. 4 Expected behaviour of modulation of polarization in ESPI.

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Fig. 5
Fig. 5 Optical and ESPI phase–shifted experimental results due to modulation of polarization for a tilted wavefront. For linear polarizer filters with azimuth angles ψ1 = 0, ψ2 = π/4, ψ3 = π/2 and ψ4 = 3π/4, the induced phase–shifts ξi = 2ψi are shown at the top of each figure. (a) Optical results and its corresponding wrapped and unwrapped phase; (b) phase–shifted correlation fringes and its corresponding wrapped and unwrapped phase.

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Fig. 6
Fig. 6 One–shot single–frame excerpts from video recording of experimental results of a varying optical phase distribution; captured interferograms (see Visualization 1) and their corresponding extracted phase (see Visualization 2) are shown. For this test, scattering plates are removed from the interferometric arrangement shown in Fig. 1. Results of the ethanoate sample under study before a vibration was induced and after the ethanoate sample was perturbed are presented.

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Fig. 7
Fig. 7 One–shot single–frame excerpts from video recording of experimental results of a varying speckle phase distribution. For this test, scattering plates are incorporated in the interferometric arrangement shown in Fig. 1. As usual, reference speckle patterns correspond to the sample before being perturbed while speckle deformed patterns correspond to those patterns registered after the perturbation was applied. Correlation fringes (see Visualization 3) and their corresponding phase (see Visualization 4) are presented. As it can be noted, correlation is mantained for different instants of time.

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Tables (1)

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Table 1 Configuration for optical and ESPI evaluation with modulation of polarization (y denotes the pulse is employed meanwhile × denotes the corresponding pulse is not employed).

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Equations (10)

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I ref ψ i = 1 + cos ( 2 ψ i − ϕ ( x , y ) ) ,
I def ψ i = 1 + cos [ 2 ψ i − ( ϕ + Δ ϕ ) ] ,
J ψ i = I ref ψ i − I def ψ i = cos ( 2 ψ i − ϕ ) − cos [ 2 ψ i − ( ϕ + Δ ϕ ) ] ,
cos ( α − β ) − cos ( α + β ) = 2 sin ( α ) sin ( β ) ,
J ψ i = 2 sin [ ( ϕ + Δ ϕ 2 ) − 2 ψ i ] sin ( Δ ϕ 2 ) .
sin ( u − v ) = sin ( u ) cos ( v ) − cos ( u ) sin ( v ) ,
J ψ i = 2 [ sin ( ϕ + Δ ϕ 2 ) cos ( 2 ψ i ) − cos ( ϕ + Δ ϕ 2 ) sin ( 2 ψ i ) ] sin ( Δ ϕ 2 ) .
J ψ 1 = 2 cos ( ϕ + Δ ϕ 2 ) sin ( Δ ϕ / 2 ) , J ψ 2 = 2 sin ( ϕ + Δ ϕ 2 ) sin ( Δ ϕ / 2 ) , J ψ 3 = 2 cos ( ϕ + Δ ϕ 2 ) sin ( Δ ϕ / 2 + π ) , J ψ 4 = 2 sin ( ϕ + Δ ϕ 2 ) sin ( Δ ϕ / 2 + π ) .
ϕ = tan − 1 [ I ref ψ 3 − I ref ψ 1 I ref ψ 2 − I ref ψ 4 ] ,               Δ ϕ + ϕ = tan − 1 [ I def ψ 3 − I def ψ 1 I def ψ 2 − I def ψ 4 ] ,
Δ ϕ = tan − 1 [ I 2 ψ 3 − I 2 ψ 1 I 2 ψ 2 − I 2 ψ 4 ] − tan − 1 [ I 1 ψ 3 − I 1 ψ 1 I 1 ψ 2 − I 1 ψ 4 ] .

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